Ninel Alver, Ege University, Türkiye
Daniel Algernon, SVTI The Swiss Association for Technical Inspections, Switzerland

Daniel Algernon, SVTI, Switzerland
Ernst Niederleithinger, BAM, Germany

Odile Abraham, Université Gustave Eiffel, France
Dimitrios Aggelis, Vrije Universiteit Brussel, Belgium
Imad Alqadi, University of Illinois at Urbana-Champaign, USA
Ninel Alver, Ege University, Türkiye
Ralf Arndt, Erfurt University of Applied Sciences, Germany
Shane Boone, BDI, USA
Necati Catbas, University of Central Florida, USA
Eleni Chatzi, ETH Zurich, Switzerland
Sattar Dorafshan, University of North Dakota, USA
Gino Ebell, BAM, Germany
Christopher Ferraro, University of Florida, USA
Christian Grosse, Technical University of Munich, Germany
Nenad Gucunski, Rutgers University, USA
Arezoo Imani, BDI, USA
Sabine Kruschwitz, BAM, Germany
Wallace Wai-lok Lai, The Hong Kong Polytechnic University, Hong Kong
Aurelia Muller, SVTI, Switzerland
Soheil Nazarian, University of Texas El Paso , USA
Didem Ozevin, University of Illinois at Chicago, USA
John Popovics, University of Illinois at Urbana-Champaign, USA
Ute Rabe, Fraunhofer Institute for Nondestructive Testing IZFP, Germany
Markus Rueegger, SVTI, Switzerland
Martin Schickert, MFPA Weimar, Germany
Thomas Schumacher, Portland State University, USA
Tomoki Shiotani, Kyoto University, Japan
Parisa Shokouhi, The Pennsylvania State University, USA
Tetsuya Suzuki, Niigata University, Japan
Claudia Thurnherr, SVTI, Switzerland
Glenn Washer, University of Missouri, USA
Herbert Wiggenhauser, Berlin, Germany
Jinying Zhu, University of Nebraska-Lincoln, USA

Yalcin Alver, Ege University, Türkiye
Serdar Avci, Ege University, Türkiye
Pelin Onelcin, Ege University, Türkiye
Sena Tayfur, Ege University, Türkiye
Cihat Yuksel, Ege University, Türkiye